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Detection of Secondary Electrons by Scintillation Detector in Variable Pressure Scanning Electron Microscopes
- 1.JIRÁK, J., ČUDEK, P., NEDĚLA, Vilém. Detection of Secondary Electrons by Scintillation Detector in Variable Pressure Scanning Electron Microscopes. In: Proceedings of the 17th IFSM International Microscopy Congress. Rio de Janeiro: Sociedade Brasileira de Microscopia e Microanilise, 2010, I10.14: 1-2. ISBN 978-85-63273-06-2.
Number of the records: 1