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Mapping of Dopants in Silicon by Injection of Electrons
- 1.HOVORKA, Miloš, FRANK, Luděk. Mapping of Dopants in Silicon by Injection of Electrons. In: Proceedings of 5th Japan-China-Norway Cooperative Symposium on Nanostructure of Advanced Materials and Nanotechnology. Toyama: University of Toyama, 2010, s. 15-18. ISBN 978-4-9903248-2-7.
Number of the records: 1