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Semiconductor laser sources at 760 nm wavelength for nanometrology
- 1.MIKEL, Břetislav, BUCHTA, Zdeněk, LAZAR, Josef, ČÍP, Ondřej. Semiconductor laser sources at 760 nm wavelength for nanometrology. In: Proceedings of the 9th WSEAS International Conference on Microelectronics, Nanoelectronics, Optoelectronic. Sofia: WSEAS EUROPMENT Press, 2010, s. 96-101. ISBN 978-954-92600-3-8. ISSN 1790-5117.
Number of the records: 1