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Non-destructive Depth Profiling of the Activated Ti-Zr-V Getter by Means of Excitation Energy Resolved Photoelectron Spectroscopy
- 1.PAVLUCH, J., ZOMMER, L., MAŠEK, K., SKÁLA, T., ŠUTARA, F., NEHASIL, V., PÍŠ, I., POLYAK, Yaroslav. Non-destructive Depth Profiling of the Activated Ti-Zr-V Getter by Means of Excitation Energy Resolved Photoelectron Spectroscopy. Analytical Sciences. 2010, 26(2), 209-215. ISSN 0910-6340. E-ISSN 1348-2246. Available: doi: 10.2116/analsci.26.209
Number of the records: 1