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Laser sources at 760 nm wavelength for metrology of length
- 1.MIKEL, Břetislav, BUCHTA, Zdeněk, LAZAR, Josef, ČÍP, Ondřej. Laser sources at 760 nm wavelength for metrology of length. In: Africon 2009. Los Alamitos: IEEE, 2009, 5308091: 1-6. ISBN 978-1-4244-3918-8. Available: doi: 10.1109/AFRCON.2009.5308091
Number of the records: 1