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Novel instrumentation for interferometric nanoscale comparator

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    ČÍŽEK, Martin, BUCHTA, Zdeněk, MIKEL, Břetislav, LAZAR, Josef, ČÍP, Ondřej. Novel instrumentation for interferometric nanoscale comparator. In: Optical Measurement Systems for Industrial Inspection VI. (Proceedings of SPIE Vol. 7389). Bellingham: SPIE, 2009, 73982Y: 1-7. ISBN 978-0-8194-7672-2. ISSN 0277-786X. Available: doi: 10.1117/12.827515
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