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Quantitative depth profiling of K-doped fullerene films using XPS and SIMS
- 1.OSWALD, S., JANDA, Pavel, DUNSCH, L. Quantitative depth profiling of K-doped fullerene films using XPS and SIMS. Microchimica Acta. 2003, 141(1-2), 79-85. ISSN 0026-3672. E-ISSN 1436-5073.
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