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Numerical Simulation of Fatigue Crack Growth in Hip Implants
- 1.0461706 - ÚGN 2017 RIV NL eng J - Journal Article
Colic, K. - Sedmak, A. - Grbovic, A. - Burzić, M. - Hloch, Sergej - Sedmak, S.
Numerical Simulation of Fatigue Crack Growth in Hip Implants.
Procedia Engineering. Roč. 149, č. 149 (2016), s. 229-235. E-ISSN 1877-7058.
[International Conference on Manufacturing Engineering and Materials, ICMEM 2016. Nový Smokovec, 06.06.2016-10.06.2016]
R&D Projects: GA MŠMT ED2.1.00/03.0082; GA MŠMT(CZ) LO1406
Institutional support: RVO:68145535
Keywords : biomedical application design * extended finite element method (XFEM) * Ti-6Al-4V alloy * stress intensity factor (SIF) * fatigue crack growth
Subject RIV: JQ - Machines ; Tools
http://www.sciencedirect.com/science/article/pii/S1877705816311699
In this paper numerical analysis of hip replacement implant behaviour from a fracture mechanics perspective is presented. It is necessary to understand the fatigue crack initiation and propagation characteristics in order to prevent catastrophic failure of the implant. For the simulation of crack propagation extended finite element method (XFEM) was used, as being one of the most advanced modeling techniques for this type of problem. Short theoretical background information on the XFEM is provided, as well as the representation of crack and the stress intensity factors computation. For chosen titanium alloy hip implants numerical modeling and analysis were done in ABAQUS software. It is shown that is possible to assume hip implant mechanical behaviour to the existence of defects such as cracks by application of numerical simulation crack behaviour. The numerical results illustrate that XFEM is efficient for the simulation of crack propagation in complicated biomedical structures, without the need to re-mesh during the propagation if the finite element mesh is well defined.
Permanent Link: http://hdl.handle.net/11104/0261290
File Download Size Commentary Version Access UGN_0461706.pdf 0 1.5 MB Publisher’s postprint open-access
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