0422680 - ÚPT 2014 CZ eng K - Conference Paper (Czech conference)
Pokorná, Zuzana
Reflectivity of very low energy electrons from polycrystalline metal samples.
Mikroskopie 2013. Praha: Československá mikroskopická společnost, 2013, s. 9.
[Mikroskopie 2013. Lednice (CZ), 13.05.2013-14.05.2013]
R&D Projects: GA TA ČR TE01020118; GA ČR GAP108/11/2270
Institutional support: RVO:68081731
Keywords : eflectivity * very low energy electros * polyctystalline metal samples
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering

The reflectivity of very low energy electrons from the surfaces of both single crystal and polycrystalline aluminium and copper was measured in a Scanning Low Energy Electron Microscope in Ultra High Vacuum conditions. This metod alows for an ultra high resolution of the order of units of nanometers even at the lowest electron energies.
Permanent Link: http://hdl.handle.net/11104/0229233