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Influence of Different InGaN/(In)GaN Growth Modes on Indium Incorporation and Quality of Layers

  1. 1.
    SYSNO0496190
    TitleInfluence of Different InGaN/(In)GaN Growth Modes on Indium Incorporation and Quality of Layers
    Author(s) Hubáček, Tomáš (FZU-D) ORCID
    Hospodková, Alice (FZU-D) RID, ORCID, SAI
    Pangrác, Jiří (FZU-D) RID, ORCID, SAI
    Zíková, Markéta (FZU-D) RID
    Oswald, Jiří (FZU-D) RID, ORCID
    Kuldová, Karla (FZU-D) RID, ORCID
    Hulicius, Eduard (FZU-D) RID, ORCID, SAI
    Corespondence/seniorHubáček, Tomáš - Korespondující autor
    Source Title Proceedings of the International Symposium on Growth of III-Nitrides ISGN-7. S. 155-155. - : University of Warsaw, 2018
    Conference International Symposium on Growth of III-Nitrides ISGN-7, 05.08.2018 - 10.08.2018, Warsaw
    Document TypeAbstrakt
    Grant LO1603 GA MŠMT - Ministry of Education, Youth and Sports (MEYS), CZ - Czech Republic
    GA16-15569S GA ČR - Czech Science Foundation (CSF)
    Institutional supportFZU-D - RVO:68378271
    Languageeng
    CountryPL
    Keywords InGaN * QW capping * MOVPE
    Permanent Linkhttp://hdl.handle.net/11104/0289016
     
Number of the records: 1  

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