Number of the records: 1
High temperature nanoindentation testing of amorphous SiC and B.sub.4./sub.C thin films
- 1.Čtvrtlík, Radim - Tomáštík, Jan - Schovánek, P.
High temperature nanoindentation testing of amorphous SiC and B4C thin films.
Defect and Diffusion Forum. Vol. 368. Zürich: Trans Tech Publications Ltd, 2016, s. 115-118. ISBN 978-3-03835-720-9. ISSN 1012-0386.
[12th International Conference on Local Mechanical Properties. Liberec (CZ), 04.11.2016-06.11.2016]
http://hdl.handle.net/11104/0268308
Number of the records: 1