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Tear film lipid layer: A molecular level view

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    SYSNO ASEP0468631
    Document TypeJ - Journal Article
    R&D Document TypeJournal Article
    Subsidiary JČlánek ve WOS
    TitleTear film lipid layer: A molecular level view
    Author(s) Cwiklik, Lukasz (UFCH-W) RID, ORCID
    Source TitleBiochimica Et Biophysica Acta-Biomembranes. - : Elsevier - ISSN 0005-2736
    Roč. 1858, č. 10 (2016), s. 2421-2430
    Number of pages10 s.
    Languageeng - English
    CountryNL - Netherlands
    Keywordstear film ; tear film lipid layer ; molecular dynamics simulations
    Subject RIVCF - Physical ; Theoretical Chemistry
    R&D ProjectsGA15-14292S GA ČR - Czech Science Foundation (CSF)
    Method of publishingOpen access
    Institutional supportUFCH-W - RVO:61388955
    UT WOS000382340100014
    EID SCOPUS84959144726
    DOI10.1016/j.bbamem.2016.02.020
    AnnotationHuman cornea is covered by an aqueous tear film, and the outermost layer of the tear film is coated by lipids. This so-called tear film lipid layer (TFLL) reduces surface tension of the tear film and helps with the film re-spreading after blinks. Alterations of tear lipids composition and properties are related to dry eye syndrome. Therefore, unveiling structural and functional properties of TFLL is necessary for understanding tear film function under both normal and pathological conditions. Key properties of TFLL, such as resistance against high lateral pressures and ability to spread at the tear film surface, are directly related to the chemical identity of TFLL lipids. Hence, a molecular-level description is required to get better insight into TFLL properties. Molecular dynamics simulations are particularly well suited for this task and they were recently used for investigating TFLL The present review discusses molecular level organization and properties of TFLL as seen by these simulation studies. This article is part of a Special Issue entitled: Biosimulations edited by Ilpo Vattulainen and Tomasz Rog. (C) 2016 Elsevier B.V. All rights reserved.
    WorkplaceJ. Heyrovsky Institute of Physical Chemistry
    ContactMichaela Knapová, michaela.knapova@jh-inst.cas.cz, Tel.: 266 053 196
    Year of Publishing2017
Number of the records: 1  

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