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Direct measurements of the ion flux at the substrate in reactive HiPIMS

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    SYSNO ASEP0464208
    Document TypeA - Abstract
    R&D Document TypeO - Ostatní
    TitleDirect measurements of the ion flux at the substrate in reactive HiPIMS
    Author(s) Čada, Martin (FZU-D) RID, ORCID, SAI
    Lundin, D. (FR)
    Hubička, Zdeněk (FZU-D) RID, ORCID, SAI
    Source TitleInternational Conference on Plasma Surface Engineering. Abstracts. ( PSE 2016 ) /15./. - Braunschweig : European Joint Committee on Plasma and Ion Surface Engineering (EJC / PISE), 2016
    S. 415-415
    Number of pages1 s.
    Publication formOnline - E
    ActionInternational Conference on Plasma Surface Engineering ( PSE 2016 )
    Event date12.09.2016 - 16.09.2016
    VEvent locationGarmisch-Partenkirchen
    CountryDE - Germany
    Event typeWRD
    Languageeng - English
    CountryDE - Germany
    KeywordsHiPIMS ; impedance ; ion flux ; reactive sputtering
    Subject RIVBL - Plasma and Gas Discharge Physics
    R&D ProjectsGA15-00863S GA ČR - Czech Science Foundation (CSF)
    TA03010743 GA TA ČR - Technology Agency of the Czech Republic (TA ČR)
    Institutional supportFZU-D - RVO:68378271
    AnnotationA direct measurement of the ion flux impinging on the substrate during ionized physical vapour deposition is valuable input when optimizing thin film deposition processes such as High-Power Impulse magnetron sputtering. However, these measurements are often complicated by the fact that they require expensive diagnostic equipment. For that reason an innovative approach consisting of an extension of a quartz crystal microbalance (QCM) sensor has been investigated in the present contribution. On top of deposition rate, the modified QCM is able to measure ionized fraction of depositing particles and ion flux on the substrate. Recently reported results proved that magnets placed at the top of the QCM sensor are able to significantly reduce electron current on the positively biased electrode attached to the crystal and in this way measure only the deposition rate of neutral particles.
    WorkplaceInstitute of Physics
    ContactKristina Potocká, potocka@fzu.cz, Tel.: 220 318 579
    Year of Publishing2017
Number of the records: 1  

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