Number of the records: 1
Investigating the thin film growth of [Ni(Hvanox).sub.2./sub.] by microscopic and spectroscopic techniques
- 1.
SYSNO ASEP 0618377 Document Type J - Journal Article R&D Document Type Journal Article Subsidiary J Článek ve WOS Title Investigating the thin film growth of [Ni(Hvanox)2] by microscopic and spectroscopic techniques Author(s) Sapre, Atharva Umesh (FZU-D) ORCID
Vlček, Jan (FZU-D) RID, ORCID
de Prado, Esther (FZU-D) ORCID, RID
Fekete, Ladislav (FZU-D) RID, ORCID
Klementová, Mariana (FZU-D) RID, ORCID
Vondráček, Martin (FZU-D) RID, ORCID
Svora, Petr (FZU-D) ORCID
Cuza, E. (IE)
Morgan, G.G. (IE)
Honolka, Jan (FZU-D) RID, ORCID
Kühne, Irina A. (FZU-D) ORCIDNumber of authors 11 Article number 2083 Source Title Nanoscale Advances. - : Royal Society of Chemistry - ISSN 2516-0230
Roč. 7, Feb (2025)Number of pages 9 s. Language eng - English Country GB - United Kingdom Keywords thin film ; AFM ; SEM ; TEM ; XRD ; 3D electron diffraction Subject RIV BM - Solid Matter Physics ; Magnetism OECD category Condensed matter physics (including formerly solid state physics, supercond.) R&D Projects GA23-05878S GA ČR - Czech Science Foundation (CSF) EH22_008/0004596 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) LM2023051 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) Method of publishing Open access Institutional support FZU-D - RVO:68378271 UT WOS 001426865500001 EID SCOPUS 85219074946 DOI https://doi.org/10.1039/d4na01021c Annotation We have investigated [Ni(Hvanox)2] (H2vanox = o-vanillinoxime), a square-planar Ni(II) complex, for the preparation of thin films using organic molecule evaporation. Low pressure experiments to prepare thin films were conducted at temperatures between 120–150 °C and thin films of increasing thicknesses [Ni(Hvanox)2] (16–336 nm) have been prepared on various substrates and been analyzed by microscopic and spectroscopic methods. Scanning electron microscopy (SEM), atomic force microscopy (AFM) and transmission electron microscopy (TEM) were used to reveal a rough surface morphology which exhibits a dense arrangement of elongated, rod and needle-like nanocrystals with random orientations. It also enabled us to follow the growth of the thin films by increasing thickness revealing the formation of a seeding layer. X-ray photoelectron spectroscopy (XPS and 3D ED), TEM and X-ray diffraction (XRD) were utilized to confirm the atomic structure and the elemental composition of the thin films. Workplace Institute of Physics Contact Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579 Year of Publishing 2026 Electronic address https://hdl.handle.net/11104/0365240
Number of the records: 1