0618377 - FZÚ 2026 RIV GB eng J - Journal Article
Sapre, Atharva Umesh - Vlček, Jan - de Prado, Esther - Fekete, Ladislav - Klementová, Mariana - Vondráček, Martin - Svora, Petr - Cuza, E. - Morgan, G.G. - Honolka, Jan - Kühne, Irina A.
Investigating the thin film growth of [Ni(Hvanox)₂] by microscopic and spectroscopic techniques.
Nanoscale Advances. Roč. 7, Feb (2025), č. článku 2083. ISSN 2516-0230. E-ISSN 2516-0230
R&D Projects: GA ČR(CZ) GA23-05878S; GA MŠMT(CZ) EH22_008/0004596; GA MŠMT LM2023051
Institutional support: RVO:68378271
Keywords : thin film * AFM * SEM * TEM * XRD * 3D electron diffraction
OECD category: Condensed matter physics (including formerly solid state physics, supercond.)
Impact factor: 4.6, year: 2023 ; AIS: 0.822, rok: 2023
Method of publishing: Open access
DOI: https://doi.org/10.1039/d4na01021c
Permanent Link: https://hdl.handle.net/11104/0365240