0602980 - FZÚ 2025 RIV GB eng J - Journal Article
Tavakkoly, M. - Chalupský, Jaromír - Hájková, Věra - Hillert, W. - Jelínek, Šimon - Juha, Libor - Makita, M. - Mazza, T. - Meyer, M. - Montaño, J. - Sinn, H. - Vozda, Vojtěch - Vannonia, M.
Comparing single-shot damage thresholds of boron carbide and silicon at the European XFEL.
Journal of Synchrotron Radiation. Roč. 31, č. 5 (2024), s. 1067-1070. ISSN 0909-0495. E-ISSN 1600-5775
R&D Projects: GA MŠMT(CZ) LM2023068
Institutional support: RVO:68378271
Keywords : damage threshold * single-shot damage threshold * B4C coating * X-ray mirrors * XFEL
OECD category: Fluids and plasma physics (including surface physics)
Impact factor: 2.4, year: 2023 ; AIS: 0.878, rok: 2023
Method of publishing: Open access
DOI: https://doi.org/10.1107/S1600577524007318
Permanent Link: https://hdl.handle.net/11104/0360257