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Comparing single-shot damage thresholds of boron carbide and silicon at the European XFEL

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    TAVAKKOLY, M., CHALUPSKÝ, J., HÁJKOVÁ, V., HILLERT, W., JELÍNEK, Š., JUHA, L., MAKITA, M., MAZZA, T., MEYER, M., MONTAÑO, J., SINN, H., VOZDA, V., VANNONIA, M. Comparing single-shot damage thresholds of boron carbide and silicon at the European XFEL. Journal of Synchrotron Radiation. 2024, 31(5), 1067-1070. ISSN 0909-0495. E-ISSN 1600-5775. Available: https://doi.org/10.1107/S1600577524007318.
Number of the records: 1  

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