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Rapid and precise large area mapping of rare-earth doping homogeneity in luminescent materials
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SYSNO ASEP 0601802 Document Type J - Journal Article R&D Document Type Journal Article Subsidiary J Článek ve WOS Title Rapid and precise large area mapping of rare-earth doping homogeneity in luminescent materials Author(s) Hrabovský, Jan (FZU-D) ORCID, RID
Kučera, M. (CZ)
Paloušová, L. (CZ)
Zázvorka, J. (CZ)
Kubát, J. (CZ)
Bi, L. (CN)
Veis, M. (CZ)Number of authors 7 Article number 251 Source Title Communications Materials. - : Nature Publishing Group
Roč. 5, č. 1 (2024)Number of pages 9 s. Language eng - English Country GB - United Kingdom Keywords physical ; optical and luminescent properties ; refractive index and optical absorption Subject RIV BM - Solid Matter Physics ; Magnetism OECD category Condensed matter physics (including formerly solid state physics, supercond.) R&D Projects EH22_008/0004596 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) EH22_008/0004591 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) Method of publishing Open access Institutional support FZU-D - RVO:68378271 UT WOS 001354780800001 EID SCOPUS 85209080138 DOI https://doi.org/10.1038/s43246-024-00679-x Annotation Doping of luminescent materials by rare-earth ions is common practice to achieve desired emission properties for a large variety of applications. As several rare-earths ions are frequently combined, it is subsequently difficult to effectively detect and control their homogeneous distribution within the host material. Here, we present a simple, rapid, large scale and precise method of rare-earth mapping using a commercial UV-Vis scanner. We discuss the influence of rare-earth distribution on the physical, optical and luminescent properties with no observable qualitative effect on photoluminescent properties and optical anisotropy. On the contrary, rare-earth-rich areas exhibit significantly higher values of refractive index and optical absorption, which allowed for their identification by the commercial scanner device. The presented method thus provides fast and accurate information about the rare-earth distribution in the material volume with high resolution (approximate to 2.7 mu m) and low limit of concentration difference detection (approximate to 0.014 at.%) compared to other techniques, which makes it a promising candidate for high throughput measurements. Workplace Institute of Physics Contact Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579 Year of Publishing 2026 Electronic address https://hdl.handle.net/11104/0366669
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