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Dataset for Enhanced photoluminescence of plasma treated recycled glass particles
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Title of dataset Dataset for Enhanced photoluminescence of plasma treated recycled glass particles Version Version 2 Author(s) Remeš, Zdeněk (FZU-D) RID, ORCID
Babčenko, Oleg (FZU-D) ORCID
Jarý, Vítězslav (FZU-D) RID, ORCID
Beranová, Klára (FZU-D) ORCIDType of datasets Dataset Language angličtina Description of the dataset Figure 1. Recycled soda-lime glass powder is a sustainable material that is also often considered as a filler in cement-based composites. The changes in the surface properties of the glass particles due to the treatments were analyzed by X-ray photoelectron spectroscopy (XPS) and optical spectroscopy. We have found, that there is a relatively high level of carbon contamination on the surface of glass particles (around 30 at.%), so plasma technology and thermal annealing were tested for the surface cleaning. Room temperature plasma treatment was not sufficient to remove carbon contamination from the surface of recycled glass particles.
Instead, the room temperature plasma treatment of recycled soda-lime glass particles leads to a significant enhancement of their room temperature photoluminescence (PL) by increasing the intensity and accelerating the decay of the photolu-minescence. The enhanced blue PL after room temperature plasma treatment was attributed to the presence of carbon contamination on the glass surface and associated charge surface and interfacial defects and interfacial states. Therefore, we propose blue photoluminescence under UV LED as a fast and inexpensive method to indicate carbon contamination on the surface of glass particles.
Figure 2. The normalized FTIR absorbance spectra measured in FTIR spectrometer with ATR accessory after low pressure plasma treatment at room temperature (a) and at 500°C (b).
Figure 3. IR Raman spectra measured in FTIR spectrometer with 1064 nm laser excitation after low pressure plasma treatment at room temperature (a) and at 500°C (b).
Figure 4. C 1s (a), and O 1s (b) XPS spectra (from top to bottom) for the “As received” sample, the samples treated in H2, O2, and N2 plasma at room temperature, annealed in H2, O2, and N2 atmosphere at 500°C, and annealed in H2, O2, and N2 plasma at 500°C. Dots represent measured data, black lines results of fits, colored lines fitting components. Peaks shaded by grey originate from carbon-oxygen contamination.
Figure 5. Ratio of selected components derived from fitting XPS spectra. We use following labels for simplification: BO: Si-O-Si bridging oxygen, NBO: Si-O-M non-bridging oxygen, H2O: oxygen from hydrous species bound to silicon (H2O, Si-OH), CO: carbon-oxygen contaminations (C-O(H), C=O, COOH), C: atomic concentration of carbon normalized to 1. The absolute uncertainty was esti-mated to be of ± 0.2 and not included in the graph for better clarity. It should be noted that a sub-stantial portion of the uncertainty is given by a systematic approach of data analysis (same in all cases) resulting in high reliability of data trends.
Figure 6. PL spectra of treated glass powder oxygen plasma. “RT plasma”, resp. “500°C plasma” represents the PL spectra measured after room temperature, resp. 500°C O2 plasma treatment, The PL spectra of as received and annealed at 500°C in O2 atmosphere (no plasma) glass powder were added for comparison.
Figure 7. PL spectra of room temperature H2 plasma treated glass powder using sinusoidal UV LED excitation at frequency of 100 kHz (a). The curve with error bars corresponds to the spectrally re-solved mean PL decay time τ calculated from the phase shift between the excitation and the emis-sion spectra. The time resolved PL emission measured by TCSPC at 450 nm is shown in (b). The instrumental response function measured at the excitation pulse wavelength (excitation pulse shape) and fitted curve were added for comparison. All measurements were done at RT.
Funding GA23-05500S
8X23025
LM2023051
EH22_008/0004596
SAV-23-13Institutional support RVO:68378271 Keywords recycling * silicon dioxide * glass * plasma * annealing * photoluminescence * Raman spectroscopy * X-ray photoelectron spectroscopy License CC BY 4.0 - Attribution-International license Contact person Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579 DOI https://doi.org/10.57680/asep.0586898
Handle: https://hdl.handle.net/11104/0354272Record owner Institute of Physics SYSNO 0586898 Date issued 18.06.2024 File Download Size Commentary Access Remes_et_al_data_v2.zip File list 89 5.1 MB open-access
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