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Dataset for Microstructure and physical properties of black aluminum antireflective films.
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Title of dataset Dataset for Microstructure and physical properties of black aluminum antireflective films. Author(s) Correa, Cinthia Antunes (FZU-D) ORCID
More Chevalier, Joris (FZU-D) ORCID, RID
Hruška, Petr (FZU-D) ORCID
Poupon, Morgane (FZU-D) ORCID, RID
Novotný, Michal (FZU-D) RID, ORCID, SAI
Minárik, P. (CZ)
Hubík, Pavel (FZU-D) RID, ORCID
Lukáč, František (UFP-V) ORCID
Fekete, Ladislav (FZU-D) RID, ORCID
Prokop, Dejan (FZU-D) ORCID, RID
Hanuš, J. (CZ)
Valenta, J. (CZ)
Fitl, Přemysl (FZU-D) RID, ORCID
Lančok, Ján (FZU-D) RID, ORCIDType of datasets Dataset Language angličtina Description of the dataset The files are related to the manuscript „Microstructure and physical properties of Black-Aluminum antireflective films“ and are organized in the sequence of appearance in the manuscript. The nomenclature of the files follows the sequence:
Figure, number of the figure appearing in the manuscript (from 1 – 7), type of data (XRD, AFM, TEM, EDX, PALS, Reflectance, Carrier concentration, Electrical mobility, or resistivity), thin film sample related to (R-Al or B-Al), film thickness (60, 180, 250, 320, or 410 nm).
TEM image files are raw, as collected, while the ones in the manuscript were cropped to show the differences between the films.
Funding GA23-05002S
EH22_008/0004596
LM2023051Institutional support RVO:68378271 ; RVO:61389021 Keywords powder x-ray diffraction * atomic force microscopy * transmission electron microscopy * energy dispersive x-ray analysis * positron annihilation spectroscopy * reflectivity, resistivity * hall measurements License CC BY 4.0 - Attribution-International license Contact person Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579 DOI https://doi.org/10.57680/asep.0585608
Handle: https://hdl.handle.net/11104/0353281Record owner Institute of Physics SYSNO 0585608 Date issued 02.05.2024 File Download Size Commentary Access Data.zip File list 90 47.5 MB open-access
Number of the records: 1