Number of the records: 1  

Dataset for Microstructure and physical properties of black aluminum antireflective films.

  1. 1.
    SYSNO ASEP0585608
    R&D Document TypeThe record was not marked in the RIV
    TitleDataset for Microstructure and physical properties of black aluminum antireflective films.
    Author(s) Correa, Cinthia Antunes (FZU-D) ORCID
    More Chevalier, Joris (FZU-D) ORCID, RID
    Hruška, Petr (FZU-D) ORCID
    Poupon, Morgane (FZU-D) ORCID, RID
    Novotný, Michal (FZU-D) RID, ORCID, SAI
    Minárik, P. (CZ)
    Hubík, Pavel (FZU-D) RID, ORCID
    Lukáč, František (UFP-V) ORCID
    Fekete, Ladislav (FZU-D) RID, ORCID
    Prokop, Dejan (FZU-D) ORCID, RID
    Hanuš, J. (CZ)
    Valenta, J. (CZ)
    Fitl, Přemysl (FZU-D) RID, ORCID
    Lančok, Ján (FZU-D) RID, ORCID
    Languageeng - English
    Keywordspowder x-ray diffraction ; atomic force microscopy ; transmission electron microscopy ; energy dispersive x-ray analysis ; positron annihilation spectroscopy ; reflectivity, resistivity ; hall measurements
    OECD categoryCondensed matter physics (including formerly solid state physics, supercond.)
    R&D ProjectsGA23-05002S GA ČR - Czech Science Foundation (CSF)
    EH22_008/0004596 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
    LM2023051 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
    Institutional supportFZU-D - RVO:68378271 ; UFP-V - RVO:61389021
    DOI https://doi.org/10.57680/asep.0585608
    AnnotationThe files are related to the manuscript „Microstructure and physical properties of Black-Aluminum antireflective films“ and are organized in the sequence of appearance in the manuscript. The nomenclature of the files follows the sequence:
    Figure, number of the figure appearing in the manuscript (from 1 – 7), type of data (XRD, AFM, TEM, EDX, PALS, Reflectance, Carrier concentration, Electrical mobility, or resistivity), thin film sample related to (R-Al or B-Al), film thickness (60, 180, 250, 320, or 410 nm).
    TEM image files are raw, as collected, while the ones in the manuscript were cropped to show the differences between the films.
    WorkplaceInstitute of Physics
    ContactKristina Potocká, potocka@fzu.cz, Tel.: 220 318 579
    Year of Publishing2025
Number of the records: 1  

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