Digital pixel test structures implemented in a 65 nm CMOS process

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SYSNO	0582691
Title	Digital pixel test structures implemented in a 65 nm CMOS process
Author(s)	Aglieri Rinella, G. (CH) Andronic, A. (DE) Antonelli, M. (IT) Aresti, M. (IT) Isakov, Artem (UJF-V) [OJS]_{ORCID, SAI} Kotliarov, Artem (UJF-V) [OJS]_{ORCID, SAI} Křížek, Filip (UJF-V) [OJS]_{RID, ORCID, SAI}
Source Title	Nuclear Instruments & Methods in Physics Research Section A. Roč. 1056, NOV (2023). - : Elsevier
Article number	168589
Document Type	Článek v odborném periodiku
Grant	LM2023040 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
Institutional support	UJF-V - RVO:61389005
Language	eng
Country	NL
Keywords	ALICE detector * Monolithic active pixel sensors * Solid state detectors
URL	https://doi.org/10.1016/j.nima.2023.168589
Permanent Link	https://hdl.handle.net/11104/0350772

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Number of the records: 1