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Digital pixel test structures implemented in a 65 nm CMOS process
- 1.0582691 - ÚJF 2024 RIV NL eng J - Journal Article
Aglieri Rinella, G. - Andronic, A. - Antonelli, M. - Aresti, M. - Isakov, Artem - Kotliarov, Artem - Křížek, Filip … Total 52 authors
Digital pixel test structures implemented in a 65 nm CMOS process.
Nuclear Instruments & Methods in Physics Research Section A. Roč. 1056, NOV (2023), č. článku 168589. ISSN 0168-9002. E-ISSN 1872-9576
R&D Projects: GA MŠMT LM2023040
Institutional support: RVO:61389005
Keywords : ALICE detector * Monolithic active pixel sensors * Solid state detectors
OECD category: Nuclear physics
Impact factor: 1.4, year: 2022
Method of publishing: Open access
https://doi.org/10.1016/j.nima.2023.168589
Permanent Link: https://hdl.handle.net/11104/0350772File Download Size Commentary Version Access 0582691.pdf 0 7.5 MB CC licence Publisher’s postprint open-access
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