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Digital pixel test structures implemented in a 65 nm CMOS process
- 1.AGLIERI RINELLA, G., ANDRONIC, A., ANTONELLI, M., ARESTI, M., ISAKOV, Artem, KOTLIAROV, Artem, KŘÍŽEK, Filip. Digital pixel test structures implemented in a 65 nm CMOS process. Nuclear Instruments & Methods in Physics Research Section A. 2023, 1056(NOV), 168589. ISSN 0168-9002. E-ISSN 1872-9576. Available: https://doi.org/10.1016/j.nima.2023.168589.
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