Automatic marker-free estimation methods for the axis of rotation in sub-micron X-ray computed tomography

0580354 - FZÚ 2024 RIV NL eng J - Journal Article
Zemek, M. - Šalplachta, J. - Zikmund, T. - Omote, K. - Takeda, Y. - Oberta, Peter - Kaiser, J.
Automatic marker-free estimation methods for the axis of rotation in sub-micron X-ray computed tomography.
Tomography of Materials and Structures. Roč. 1, Mar. (2023), č. článku 100002. ISSN 2949-673X
R&D Projects: GA MŠMT LM2018110
Institutional support: RVO:68378271
Keywords : computed tomography * rotation axis * tuning-fork artifact * automatic
OECD category: Optics (including laser optics and quantum optics)
Method of publishing: Open access

Misalignment of the rotation axis causes severe artifacts in X-ray computed tomography. Calibration of this parameter is often insufficient for sub-micron resolution measurements and needs to be corrected during the post-processing. This correction can be accelerated by various automatic methods. These vary in mechanisms and performance, making them suitable for different use-cases. This work summarizes existing automatic methods for estimating the rotation axis in X-ray computed tomography, with a focus on sub-micron applications. Some of the methods are implemented and compared in the context of a laboratory sub-micron scanner to demonstrate practical considerations of this task.
Permanent Link: https://hdl.handle.net/11104/0349138