Number of the records: 1  

Ion emission from plasmas produced by femtosecond pulses of short-wavelength free-electron laser radiation focused on massive targets: an overview and comparison with long-wavelength laser ablation

  1. 1.
    SYSNO ASEP0578230
    Document TypeC - Proceedings Paper (int. conf.)
    R&D Document TypeConference Paper
    TitleIon emission from plasmas produced by femtosecond pulses of short-wavelength free-electron laser radiation focused on massive targets: an overview and comparison with long-wavelength laser ablation
    Author(s) Krása, Josef (FZU-D) RID, ORCID
    Nassisi, V. (IT)
    Burian, Tomáš (FZU-D) RID, ORCID
    Hájková, Věra (FZU-D) RID, ORCID
    Chalupský, Jaromír (FZU-D) RID, ORCID
    Jelínek, Šimon (FZU-D) ORCID
    Frantálová, Kateřina (FZU-D) ORCID
    Krupka, Michal (FZU-D) ORCID
    Kuglerová, Zuzana (FZU-D) ORCID
    Singh, Sushil K. (FZU-D) ORCID
    Vozda, Vojtěch (FZU-D) ORCID
    Vyšín, Luděk (FZU-D) RID, ORCID
    Wild, J. (CZ)
    Šmíd, M. (DE)
    Toleikis, I. (DE)
    Falk, Kateřina (FZU-D) ORCID
    Juha, Libor (FZU-D) RID, ORCID, SAI
    Number of authors38
    Article number125780J
    Source TitleProceedings of SPIE, Optics Damage and Materials Processing by EUV/X-ray Radiation. - Bellingham : SPIE, 2023 / Juha L. ; Bajt S. ; Guizard S. - ISSN 0277-786X - ISBN 9781510662766
    Number of pages9 s.
    Publication formOnline - E
    ActionConference on Optics Damage and Materials Processing by EUV/X-ray Radiation VIII (XDam8)
    Event date24.04.2023 - 26.04.2023
    VEvent locationPrague
    CountryCZ - Czech Republic
    Event typeWRD
    Languageeng - English
    CountryUS - United States
    Keywordsablation ; nanosecond pulses ; femtosecond pulses ; UV excimer laser ; soft-x-ray laser ; free-electron laser ; ion diagnostics ; ion detector function
    Subject RIVBH - Optics, Masers, Lasers
    OECD categoryFluids and plasma physics (including surface physics)
    R&D ProjectsLM2023068 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
    GA20-08452S GA ČR - Czech Science Foundation (CSF)
    Institutional supportFZU-D - RVO:68378271
    EID SCOPUS85170825537
    DOI https://doi.org/10.1117/12.2670113
    AnnotationWe report on ion emission from plasma produced on thick targets irradiated with nanosecond and femtosecond pulses delivered by mid-ultraviolet and soft x-ray lasers, respectively. To distinguish between different ion acceleration mechanisms, the maximum kinetic energy of ions produced under different interaction conditions is plotted versus laser fluence. The transformation of the time-of-flight detector signal into ion charge density distance-of-flight spectra makes it possible to determine the mean kinetic energy of the fastest ion groups based on the influence of the acoustic velocity of ion expansion. This allows obtaining additional characteristics of the ion production.
    WorkplaceInstitute of Physics
    ContactKristina Potocká, potocka@fzu.cz, Tel.: 220 318 579
    Year of Publishing2024
    Electronic addresshttps://www.spiedigitallibrary.org/conference-proceedings-of-spie/12578/125780J/Ion-emission-from-plasmas-produced-by-femtosecond-pulses-of-short/10.1117/12.2670113.short
Number of the records: 1  

  This site uses cookies to make them easier to browse. Learn more about how we use cookies.