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Picosecond pulsed laser deposition of MoS.sub.2./sub. thin films
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SYSNO ASEP 0573259 Document Type J - Journal Article R&D Document Type Journal Article Subsidiary J Článek ve WOS Title Picosecond pulsed laser deposition of MoS2 thin films Author(s) Quiñones-Galvan, J.G. (MX)
Mirza, M. Inam (FZU-D) ORCID
Hrabovský, Jan (FZU-D) ORCID
Campos-Gonzalez, E. (MX)
de Moure-Flores, F. (MX)
Santos-Cruz, J. (MX)
Santana-Aranda, M.A. (MX)
Bulgakov, Alexander (FZU-D) ORCID
Bulgakova, Nadezhda M. (FZU-D) ORCIDNumber of authors 9 Source Title MM Science Journal. - : MM publishing - ISSN 1803-1269
Roč. 2023, June (2023), s. 6421-6425Number of pages 5 s. Language eng - English Country CZ - Czech Republic Keywords 2D materials ; picosecond laser ablation ; thin films ; MoS2 ; PLD ; time-of-flight distributions Subject RIV BH - Optics, Masers, Lasers OECD category Optics (including laser optics and quantum optics) R&D Projects EF15_003/0000445 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) Method of publishing Open access Institutional support FZU-D - RVO:68378271 UT WOS 001006578100001 EID SCOPUS 85161643435 DOI 10.17973/MMSJ.2023_06_2023003 Annotation MoS2 thin films were grown by the pulsed laser deposition technique using a picosecond laser at a wavelength of 1030 nm. The plasma ion mean kinetic energy and density were estimated from the time-of-flight distributions measured using a Langmuir planar probe. It has been found that the mean kinetic energy decreases with increasing the laser pulse energy. This unusual effect is explained by the difference in the volatility of the vaporized species. Samples were structurally characterized by Raman spectroscopy and grazing angle X-ray diffraction. It was found that thin films of amorphous matrices containing MoS2 nanocrystallites were grown. Optical characterization carried out by UV-vis spectroscopy yielded transmittance values above 90% in the visible spectral range and an indirect electronic transition at 1.4 eV. Workplace Institute of Physics Contact Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579 Year of Publishing 2024 Electronic address https://hdl.handle.net/11104/0343729
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