Number of the records: 1
Effect of irradiation and annealing performed with bias voltage applied across the coupling capacitors on the interstrip resistance of ATLAS ITk silicon strip sensors
- 1.
SYSNO 0570817 Title Effect of irradiation and annealing performed with bias voltage applied across the coupling capacitors on the interstrip resistance of ATLAS ITk silicon strip sensors Author(s) Kroll, Jiří (FZU-D) ORCID
Allport, P. P. (GB)
Chisholm, A. (GB)
Dudáš, D. (CZ)
Fadeyev, V. (US)
George, W. (GB)
Gonella, L. (GB)
Kopsalis, I. (GB)
Kvasnička, Jiří (FZU-D) RID, ORCID
Latoňová, Věra (FZU-D) ORCID
Lomas, J. (GB)
Martinez-Mckinney, F. (US)
Mikeštíková, Marcela (FZU-D) RID, ORCID
Shi, X. (CN)
Tůma, Pavel (FZU-D)
Ullan, M. (ES)
Unno, Y. (JP)Corespondence/senior Kroll, Jiří - Korespondující autor Source Title Nuclear Instruments & Methods in Physics Research Section A. Roč. 1047, Feb (2023). - : Elsevier Article number 167726 Document Type Článek v odborném periodiku Grant LTT17018 GA MŠMT - Ministry of Education, Youth and Sports (MEYS), CZ - Czech Republic LM2018104 GA MŠMT - Ministry of Education, Youth and Sports (MEYS), CZ - Czech Republic Institutional support FZU-D - RVO:68378271 Language eng Country NL Keywords ATLAS inner tracker * silicon strip sensors * gamma irradiation * annealing URL https://doi.org/10.1016/j.nima.2022.167726 Permanent Link https://hdl.handle.net/11104/0342156
Number of the records: 1