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Direct LiF imaging diagnostics on refractive X-ray focusing at the EuXFEL high energy density instrument
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SYSNO ASEP 0568523 Document Type J - Journal Article R&D Document Type Journal Article Subsidiary J Článek ve WOS Title Direct LiF imaging diagnostics on refractive X-ray focusing at the EuXFEL high energy density instrument Author(s) Makarov, S. (RU)
Makita, M. (DE)
Nakatsutsumi, M. (DE)
Pikuz, T. (RU)
Ozaki, N. (JP)
Preston, T.R. (DE)
Appel, K. (DE)
Konopková, Z. (DE)
Cerantola, V. (IT)
Brambrink, E. (DE)
Schwinkendorf, J.P. (DE)
Mohacsi, I. (DE)
Burian, Tomáš (FZU-D) RID, ORCID
Chalupský, Jaromír (FZU-D) RID, ORCID
Hájková, Věra (FZU-D) RID, ORCID
Juha, Libor (FZU-D) RID, ORCID, SAI
Vozda, Vojtěch (FZU-D) ORCID
Nagler, B. (US)
Zastrau, U. (DE)
Pikuz, S. (RU)Number of authors 20 Source Title Journal of Synchrotron Radiation. - : Oxford Blackwell - ISSN 0909-0495
Roč. 30, Jan. (2023), s. 208-216Number of pages 9 s. Language eng - English Country GB - United Kingdom Keywords X-ray free-electron lasers ; X-ray focusing ; X-ray beam characterization ; compound refractive lenses ; focusing system ; lithium fluoride (LiF) detector Subject RIV BH - Optics, Masers, Lasers OECD category Optics (including laser optics and quantum optics) R&D Projects GA20-08452S GA ČR - Czech Science Foundation (CSF) GA17-05167s GA ČR - Czech Science Foundation (CSF) Method of publishing Open access Institutional support FZU-D - RVO:68378271 UT WOS 000908417600019 EID SCOPUS 85145536582 DOI https://doi.org/10.1107/S1600577522006245 Annotation The application of fluorescent crystal media in wide-range X-ray detectors provides an opportunity to directly image the spatial distribution of ultraintense X-ray beams including investigation of the focal spot of free-electron lasers. Here the capabilities of the micro- and nano-focusing X-ray refractive optics available at the High Energy Density instrument of the European XFEL are reported, as measured in situ by means of a LiF fluorescent detector placed into and around the beam caustic. The intensity distribution of the beam focused down to several hundred nanometers was imaged at 9 keV photon energy. A deviation from the parabolic surface in a stack of nanofocusing Be compound refractive lenses (CRLs) was found to affect the resulting intensity distribution within the beam. Comparison of experimental patterns in the far field with patterns calculated for different CRL lens imperfections allowed the overall inhomogeneity in the CRL stack to be estimated. Workplace Institute of Physics Contact Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579 Year of Publishing 2024 Electronic address https://hdl.handle.net/11104/0341768
Number of the records: 1