Real-time spatial characterization of micrometer-sized X-ray free-electron laser beams focused by bendable mirrors

Mercurio, G.; Chalupský, Jaromír; Nistea, I.T.; Schneider, M.; Hájková, Věra; Gerasimova, N.; Carley, R.; Cascella, M.; Le Guyader, L.; Mercadier, L.; Schlappa, J.; Setoodehnia, K.; Teichmann, M.; Yaroslavtsev, A.; Burian, Tomáš; Vozda, Vojtěch; Vyšín, Luděk; Wild, J.; Hickin, D.; Silenzi, A.; Stupar, M.; Delitz, J.T.; Broers, C.; Reich, A.; Pfau, B.; Eisebitt, S.; La Civita, D.; Sinn, H.; Vannoni, M.; Alcock, S.G.; Juha, Libor; Scherz, A.

doi:https://dx.doi.org/10.1364/OE.455948

Number of the records: 1

Real-time spatial characterization of micrometer-sized X-ray free-electron laser beams focused by bendable mirrors

1.

SYSNO ASEP	0558653
Document Type	J - Journal Article
R&D Document Type	Journal Article
Subsidiary J	Článek ve WOS
Title	Real-time spatial characterization of micrometer-sized X-ray free-electron laser beams focused by bendable mirrors
Author(s)	Mercurio, G. (DE) Chalupský, Jaromír (FZU-D)_{RID, ORCID} Nistea, I.T. (GB) Schneider, M. (DE) Hájková, Věra (FZU-D)_{RID, ORCID} Gerasimova, N. (DE) Carley, R. (DE) Cascella, M. (DE) Le Guyader, L. (DE) Mercadier, L. (DE) Schlappa, J. (DE) Setoodehnia, K. (DE) Teichmann, M. (DE) Yaroslavtsev, A. (SE) Burian, Tomáš (FZU-D)_{RID, ORCID} Vozda, Vojtěch (FZU-D)_ORCID Vyšín, Luděk (FZU-D)_{RID, ORCID} Wild, J. (CZ) Hickin, D. (DE) Silenzi, A. (DE) Stupar, M. (DE) Delitz, J.T. (DE) Broers, C. (DE) Reich, A. (DE) Pfau, B. (DE) Eisebitt, S. (DE) La Civita, D. (DE) Sinn, H. (DE) Vannoni, M. (DE) Alcock, S.G. (GB) Juha, Libor (FZU-D)_{RID, ORCID, SAI} Scherz, A. (DE)
Number of authors	32
Source Title	Optics Express. - : Optical Society of America - ISSN 1094-4087 Roč. 30, č. 12 (2022), s. 20980-20998
Number of pages	11 s.
Language	eng - English
Country	US - United States
Keywords	X-ray free-electron laser ; real-time spacial characterization of beams ; bendable mirrors used
Subject RIV	BH - Optics, Masers, Lasers
OECD category	Optics (including laser optics and quantum optics)
R&D Projects	GA20-08452S GA ČR - Czech Science Foundation (CSF)
	LM2018114 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
Method of publishing	Open access
Institutional support	FZU-D - RVO:68378271
UT WOS	000810533400065
EID SCOPUS	85131085647
DOI	10.1364/OE.455948
Annotation	A real-time and accurate characterization of the X-ray beam size is essential to enable a large variety of different experiments at free-electron laser facilities. Typically, ablative imprints are employed to determine shape and size of μm-focused X-ray beams. The high accuracy of this state-of-the-art method comes at the expense of the time required to perform an ex-situ image analysis. In contrast, diffraction at a curved grating with suitably varying period and orientation forms a magnified image of the X-ray beam, which can be recorded by a 2D pixelated detector providing beam size and pointing jitter in real time. In this manuscript, we compare results obtained with both techniques, address their advantages and limitations, and demonstrate their excellent agreement. We present an extensive characterization of the FEL beam focused to ≈1 μm by two Kirkpatrick-Baez (KB) mirrors, along with optical metrology slope profiles demonstrating their exceptionally high quality.
Workplace	Institute of Physics
Contact	Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579
Year of Publishing	2023
Electronic address	http://hdl.handle.net/11104/0332382

Number of the records: 1