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Real-time spatial characterization of micrometer-sized X-ray free-electron laser beams focused by bendable mirrors
- 1.Mercurio, G., Chalupský, J., Nistea, I.T., Schneider, M., Hájková, V., Gerasimova, N., Carley, R., Cascella, M., Le Guyader, L., Mercadier, L., Schlappa, J., Setoodehnia, K., Teichmann, M., Yaroslavtsev, A., Burian, T., Vozda, V., Vyšín, L., Wild, J., Hickin, D., Silenzi, A., Stupar, M., Delitz, J.T., Broers, C., Reich, A., Pfau, B., Eisebitt, S., La Civita, D., Sinn, H., Vannoni, M., Alcock, S.G., Juha, L., Scherz, A. Real-time spatial characterization of micrometer-sized X-ray free-electron laser beams focused by bendable mirrors. Optics Express. 2022, 30(12), 20980-20998. ISSN 1094-4087. Available: doi: 10.1364/OE.455948.
Number of the records: 1