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Traceable reference full metrology chain for innovative aspheric and freeform optical surfaces accurate at the nanometer level
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SYSNO 0555695 Title Traceable reference full metrology chain for innovative aspheric and freeform optical surfaces accurate at the nanometer level Author(s) Arezki, Y. (FR)
Su, R. (GB)
Heikkinen, V. (FI)
Leprete, F. (FR)
Psota, Pavel (UFP-V) [TOPTEC] RID, ORCID
Bitou, Y. (JP)
Schober, C. (DE)
Mehdi-Souzani, C. (FR)
Alzahrani, B. A. M. (SA)
Zhang, X. (CN)
Kondo, Y. (JP)
Prüss, J. (DE)
Lédl, Vít (UFP-V) [TOPTEC] RID
Anwer, N. (FR)
Bouazizi, M. L. (SA)
Leach, R. (GB)
Nouira, H. (FR)Source Title Sensors. Roč. 21, č. 4 (2021), s. 1-19. - : MDPI Article number 1103 Document Type Článek v odborném periodiku Institutional support UFP-V - RVO:61389021 Language eng Country CH Keywords Aspheric and freeform optical elements * Dimensional metrology * Measured data evaluation * Robust reference minimum zone (Hybrid Trust Region) fitting * Ultra-high precision measuring machine * Uncertainty Cooperating institutions Universite Paris-Saclay (France)
University of Nottingham (United Kingdom)
VTT Technical Research Centre of Finland (Finland)
Etablissement de Saint Heand (France)
National Metrology Institute of Japan (Japan)
Universität Stuttgart (Germany)
Prince Sattam Bin Abdulaziz University (Saudi Arabia)
Fudan University
Laboratoire National de Metrologie et d'Essais (France)URL https://www.mdpi.com/1424-8220/21/4/1103 Permanent Link http://hdl.handle.net/11104/0330159
Number of the records: 1