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In situ monitoring of pulsed laser annealing of Eu-doped oxide thin films
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SYSNO ASEP 0552117 Document Type J - Journal Article R&D Document Type Journal Article Subsidiary J Článek ve WOS Title In situ monitoring of pulsed laser annealing of Eu-doped oxide thin films Author(s) Novotný, Michal (FZU-D) RID, ORCID, SAI
Remsa, Jan (FZU-D) RID, ORCID
Havlová, Šárka (FZU-D) ORCID
More Chevalier, Joris (FZU-D) ORCID
Irimiciuc, Stefan (FZU-D) ORCID
Chertopalov, Sergii (FZU-D) ORCID
Písařík, Petr (FZU-D) RID, ORCID
Volfová, Lenka (FZU-D) ORCID
Fitl, Přemysl (FZU-D) RID, ORCID
Kmječ, Tomáš (FZU-D) ORCID
Vrňata, M. (CZ)
Lančok, Ján (FZU-D) RID, ORCIDNumber of authors 12 Article number 7576 Source Title Materials. - : MDPI
Roč. 14, č. 24 (2021)Number of pages 13 s. Language eng - English Country CH - Switzerland Keywords pulsed laser deposition ; pulsed laser annealing ; zinc oxide ; lutetium oxide ; titanium oxide ; europium ; in situ monitoring ; photoluminescence Subject RIV BM - Solid Matter Physics ; Magnetism OECD category Coating and films R&D Projects GA18-17834S GA ČR - Czech Science Foundation (CSF) Method of publishing Open access Institutional support FZU-D - RVO:68378271 UT WOS 000738384800001 EID SCOPUS 85121326735 DOI 10.3390/ma14247576 Annotation Eu3+ doped oxide thin films possess a great potential for several emerging applications in optics, optoelectronics, and sensors. The applications demand maximizing Eu3+ photoluminescence response. Eu-doped ZnO, TiO2, and Lu2O3 thin films were deposited by Pulsed Laser Deposition (PLD). Pulsed UV Laser Annealing (PLA) was utilized to modify the properties of the films. In situ monitoring of the evolution of optical properties photoluminescence and transmittance) at PLA was realized to optimize efficiently PLA conditions. The changes in optical properties were related to structural, microstructural, and surface properties characterized by X-ray diffraction (XRD)and atomic force microscopy (AFM). The substantial increase of Eu3+ emission was observed for all annealed materials. PLA induces crystallization of TiO2 and Lu2O3 amorphous matrix, while in the case of already nanocrystalline ZnO, rather surface smoothening related grains’ coalescence was observed. Workplace Institute of Physics Contact Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579 Year of Publishing 2022 Electronic address http://hdl.handle.net/11104/0327271
Number of the records: 1