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Quantification of stem images in high resolution sem for segmented and pixelated detectors
- 1.KONVALINA, Ivo, PATÁK, Aleš, ZOUHAR, Martin, MÜLLEROVÁ, Ilona, FOŘT, Tomáš, UNČOVSKÝ, M., MATERNA MIKMEKOVÁ, Eliška. Quantification of stem images in high resolution sem for segmented and pixelated detectors. Nanomaterials. 2022, 12(1), 71. ISSN 2079-4991. E-ISSN 2079-4991. Available: https://doi.org/10.3390/nano12010071.
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