Trajectory displacement in a multi beam scanning electron microscope

Number of the records: 1

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SYSNO	0549399
Title	Trajectory displacement in a multi beam scanning electron microscope
Author(s)	Stopka, Jan (UPT-D)_{ORCID, SAI} Zuidema, W. (NL) Kruit, P. (NL)
Corespondence/senior	Stopka, Jan - Korespondující autor
Source Title	Ultramicroscopy. Roč. 223, April (2021). - : Elsevier
Article number	113223
Document Type	Článek v odborném periodiku
Grant	TE01020118 GA TA ČR - Technology Agency of the Czech Republic (TA ČR), CZ - Czech Republic
	LO1212 GA MŠMT - Ministry of Education, Youth and Sports (MEYS), CZ - Czech Republic
	ED0017/01/01 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
Institutional support	UPT-D - RVO:68081731
Language	eng
Country	NL
Keywords	Trajectory displacement * Multi-beam electron microscope * Coulomb interactions * Slice method * Electron optics
Cooperating institutions	Delft University of Technology (Netherlands)
URL	https://www.sciencedirect.com/science/article/pii/S030439912100019X
Permanent Link	http://hdl.handle.net/11104/0325417

Number of the records: 1