Number of the records: 1
Trajectory displacement in a multi beam scanning electron microscope
- 1.0549399 - ÚPT 2022 RIV NL eng J - Journal Article
Stopka, Jan - Zuidema, W. - Kruit, P.
Trajectory displacement in a multi beam scanning electron microscope.
Ultramicroscopy. Roč. 223, April (2021), č. článku 113223. ISSN 0304-3991. E-ISSN 1879-2723
R&D Projects: GA TA ČR(CZ) TE01020118; GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01
Institutional support: RVO:68081731
Keywords : Trajectory displacement * Multi-beam electron microscope * Coulomb interactions * Slice method * Electron optics
OECD category: Optics (including laser optics and quantum optics)
Impact factor: 2.994, year: 2021 ; AIS: 0.857, rok: 2021
Method of publishing: Open access
Result website:
https://www.sciencedirect.com/science/article/pii/S030439912100019XDOI: https://doi.org/10.1016/j.ultramic.2021.113223
Permanent Link: http://hdl.handle.net/11104/0325417
Number of the records: 1