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Effect of Auger recombination on transient optical properties in XUV and soft X-ray irradiated silicon nitride
- 1.0545328 - FZÚ 2022 RIV DE eng J - Journal Article
Tkachenko, V. - Lipp, V. - Buescher, M. - Capotondi, F. - Hoeppner, H. - Medvedev, Nikita - Pedersoli, E. - Prandolini, M.J. - Rossi, G.M. - Tavella, F. - Toleikis, S. - Windeler, M. - Ziaja, B. - Teubner, U.
Effect of Auger recombination on transient optical properties in XUV and soft X-ray irradiated silicon nitride.
Scientific Reports. Roč. 11, č. 1 (2021), č. článku 5203. ISSN 2045-2322. E-ISSN 2045-2322
R&D Projects: GA MŠMT LTT17015
EU Projects: European Commission(XE) 654148 - LASERLAB-EUROPE
Institutional support: RVO:68378271
Keywords : temporal diagnostics of FEL pulses * optical properties of silicon nitride irradiated by XUV and soft X-ray
OECD category: Fluids and plasma physics (including surface physics)
Impact factor: 4.997, year: 2021 ; AIS: 1.208, rok: 2021
Method of publishing: Open access
DOI: https://doi.org/10.1038/s41598-021-84677-w
Permanent Link: http://hdl.handle.net/11104/0322052File Download Size Commentary Version Access 0545328.pdf 2 2.4 MB CC Licence Publisher’s postprint open-access
Number of the records: 1