0544249 - ÚFCH JH 2022 RIV US eng J - Journal Article
Marchand, R. - Šachl, Radek - Kalbáč, Martin - Hof, Martin - Tromp, R. - Amaro, Mariana Manuela - van der Molen, M. - Juffmann, T.
Optical Near-Field Electron Microscopy.
Physical Review Applied. Roč. 16, č. 1 (2021), č. článku 014008. ISSN 2331-7019. E-ISSN 2331-7019
R&D Projects: GA ČR(CZ) GX19-26854X
Institutional support: RVO:61388955
Keywords : Electron microscopy * Image resolution * Optical imaging technique * Membrane
OECD category: Physical chemistry
Impact factor: 4.931, year: 2021 ; AIS: 1.483, rok: 2021
Method of publishing: Limited access
DOI: https://doi.org/10.1103/PhysRevApplied.16.014008
Permanent Link: http://hdl.handle.net/11104/0321279