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Multi-direction channelling study of the Ag:YSZ nanocomposites prepared by ion implantation
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SYSNO ASEP 0539468 Document Type J - Journal Article R&D Document Type Journal Article Subsidiary J Článek ve WOS Title Multi-direction channelling study of the Ag:YSZ nanocomposites prepared by ion implantation Author(s) Mikšová, Romana (UJF-V) RID, ORCID, SAI
Jagerová, Adéla (UJF-V) ORCID, SAI
Malinský, Petr (UJF-V) RID, ORCID, SAI
Harcuba, P. (CZ)
Veselý, J. (CZ)
Holý, V. (CZ)
Kentsch, U. (DE)
Macková, Anna (UJF-V) RID, ORCID, SAINumber of authors 8 Article number 109773 Source Title Vacuum. - : Elsevier - ISSN 0042-207X
Roč. 184, FEB (2021)Number of pages 11 s. Publication form Print - P Language eng - English Country GB - United Kingdom Keywords Ag-ion implantation ; Yttria-stabilised zirconia ; damage accumulation ; strain relaxation ; nanoparticles Subject RIV BG - Nuclear, Atomic and Molecular Physics, Colliders OECD category Materials engineering R&D Projects LM2015056 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) GA18-03346S GA ČR - Czech Science Foundation (CSF) Method of publishing Limited access Institutional support UJF-V - RVO:61389005 UT WOS 000604850800002 EID SCOPUS 85091829122 DOI https://doi.org/10.1016/j.vacuum.2020.109773 Annotation The paper reports on implantation damage accumulation, Ag distribution and the interior morphology in different crystallographic orientations of implanted samples of cubic yttria-stabilised zirconia (YSZ). (100)-, (110)- and (111)-oriented YSZ was implanted with 400-keV Ag+ ions at ion fluences from 5 x 10(14) to 5 x 10(16) cm(-2). Rutherford backscattering spectrometry (RBS) in the channelling mode (RBS-C), as well as X-ray diffraction (XRD), were used for the quantitative measurement of the lattice disorder and Ag distribution. The defect propagation and Ag accumulation were observed using transmission electron microscopy (TEM) with the energy-dispersive X-ray spectroscopy (EDX). Although similar damage evolution trends were observed along with all channelling directions, the disorder accumulation is lower along the 110 direction than along the 100 and 111 direction. The damage extends much deeper than the theoretically predicted depths. It is attributed to long-range defect migration effects, confirmed by TEM. At the ion fluence of 5 x 10(16) cm(-2), nanometre-sized Ag precipitates were identified in the depth of 30-130 nm based on the Ag concentration-depth profiles determined by RBS. Workplace Nuclear Physics Institute Contact Markéta Sommerová, sommerova@ujf.cas.cz, Tel.: 266 173 228 Year of Publishing 2022 Electronic address https://doi.org/10.1016/j.vacuum.2020.109773
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