Study of electron scattering phenomena of advanced materials by UHV SLEEM/ToF

Number of the records: 1

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SYSNO	0536979
Title	Study of electron scattering phenomena of advanced materials by UHV SLEEM/ToF
Author(s)	Konvalina, Ivo (UPT-D)_{RID, ORCID, SAI} Daniel, Benjamin (UPT-D)_RID Zouhar, Martin (UPT-D)_{ORCID, RID, SAI} Paták, Aleš (UPT-D)_{RID, ORCID, SAI} Piňos, Jakub (UPT-D)_{RID, ORCID, SAI} Radlička, Tomáš (UPT-D)_{RID, ORCID, SAI} Frank, Luděk (UPT-D)_{RID, SAI, ORCID} Müllerová, Ilona (UPT-D)_{RID, SAI, ORCID} Materna Mikmeková, Eliška (UPT-D)_{ORCID, RID, SAI}
Source Title	Microscopy 2020. S. 95-96. - Praha : Československá mikroskopická společnost, 2020
Conference	Microscopy 2020, 06.10.2020 - 07.10.2020, Lednice
Document Type	Abstrakt
Grant	TN01000008 GA TA ČR - Technology Agency of the Czech Republic (TA ČR), CZ - Czech Republic
Institutional support	UPT-D - RVO:68081731
Language	eng
Country	CZ
Keywords	electron scattering phenomena
Permanent Link	http://hdl.handle.net/11104/0314731

Number of the records: 1