Number of the records: 1
Effect of implantation of C, Si and Cu into ZrNb nanometric multilayers
- 1.0525525 - ÚJF 2021 RIV CZ eng C - Conference Paper (international conference)
Daghbouj, N. - Karlík, M. - Lorinčík, J. - Polcar, T. - Callisti, M. - Havránek, Vladimír
Effect of implantation of C, Si and Cu into ZrNb nanometric multilayers.
METAL 2019 - 28th International Conference on Metallurgy and Materials, Conference Proceedings. Ostrava: TANGER Ltd., 2019, Č. 944, č. článku 949. Roč. 1. ISBN 978-80-87294-92-5.
[Metal 2019 - 28th International Conference on Metallurgy and Materials. Brno (CZ), 22.05.2019-24.05.2019]
R&D Projects: GA MŠMT EF16_013/0001812; GA MŠMT LM2015056
Institutional support: RVO:61389005
Keywords : Zr/Nb multilayers * ion irradiation * strain * XRD * SIMS
OECD category: Materials engineering
DOI: https://doi.org/10.37904/metal.2019.735
Permanent Link: http://hdl.handle.net/11104/0309638
Number of the records: 1