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Study of charge carrier trapping by EPR and TSL methods in Zn.sub.x./sub.Mg.sub.1-x./sub.WO.sub.4./sub. single crystals
- 1.KRUTYAK, N., SPASSKY, D.A., NAGIRNYI, V., BURYI, Maksym, TUPITSYNA, I., DUBOVIK, A. Study of charge carrier trapping by EPR and TSL methods in ZnxMg1-xWO4 single crystals. Optical Materials. 2019, 96(Oct), 1-8), 109362. ISSN 0925-3467. E-ISSN 1873-1252. Available: https://doi.org/10.1016/j.optmat.2019.109362.
Number of the records: 1