Number of the records: 1
Kelvin probe force microscopy
- 1.0501461 CH BXXS
Sadewasser, S. (ed.) - Glatzel, T. (ed.)
Kelvin probe force microscopy.
Cham: Springer International Publishing, 2018. Springer Series in Surface Sciences, 65. ISBN 978-3-319-75686-8. ISSN 0931-5195
Number of the records: 1