Characterization of hydrogenated silicon thin films and diode structures with integrated germanium nanoparticles

Number of the records: 1

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SYSNO	0496537
Title	Characterization of hydrogenated silicon thin films and diode structures with integrated germanium nanoparticles
Author(s)	Stuchlík, Jiří (FZU-D)_{RID, ORCID} Fajgar, Radek (UCHP-M)_{RID, ORCID, SAI} Kupčík, Jaroslav (UCHP-M)_{RID, ORCID, SAI} Remeš, Zdeněk (FZU-D)_{RID, ORCID} Stuchlíková, The-Ha (FZU-D)_{RID, ORCID}
Source Title	Nanocon 2017 : conference proceedings : 9th International Conference on Nanomaterials - Research & Application. S. 123-127. - Ostrava : Tanger Ltd., 2018
Conference	NANOCON 2017. International Conference on Nanomaterials - Research & Application /9./, 18.10.2017 - 20.10.2017, Brno
Document Type	Konferenční příspěvek (zahraniční konf.)
Grant	KONNECT-007, CZ - Czech Republic, KR - South Korea
	LTC17029 GA MŠMT - Ministry of Education, Youth and Sports (MEYS), CZ - Czech Republic
Institutional support	FZU-D - RVO:68378271 ; UCHP-M - RVO:67985858
Language	eng
Country	CZ
Keywords	PECVD * a-Si:H diode structures * Ge * nanoparticles
Permanent Link	http://hdl.handle.net/11104/0289330

Number of the records: 1