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Characterization of hydrogenated silicon thin films and diode structures with integrated germanium nanoparticles
- 1.STUCHLÍK, J., FAJGAR, R., KUPČÍK, J., REMEŠ, Z., STUCHLÍKOVÁ, T.-H. Characterization of hydrogenated silicon thin films and diode structures with integrated germanium nanoparticles. In: Nanocon 2017 : conference proceedings : 9th International Conference on Nanomaterials - Research & Application. Ostrava: Tanger Ltd., 2018, s. 123-127. ISBN 9788087294819.
Number of the records: 1