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Correlative Raman-SEM imaging of sp2-sp3 hybridized carbon heterostructures
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SYSNO ASEP 0486983 Document Type A - Abstract R&D Document Type O - Ostatní Title Correlative Raman-SEM imaging of sp2-sp3 hybridized carbon heterostructures Author(s) Varga, Marián (FZU-D) RID, ORCID
Vretenár, V. (SK)
Váňa, R. (CZ)
Potocký, Štěpán (FZU-D) RID, ORCID
Kromka, Alexander (FZU-D) RID, ORCID, SAINumber of authors 5 Source Title 2nd International Conference on Applied Surface Science (ICASS). - Dalian, 2017 / Rudolph H. - ISSN 0169-4332 Number of pages 1 s. Publication form Online - E Action International Conference on Applied Surface Science (ICASS) /2./ Event date 12.06.2017 - 15.06.2017 VEvent location Dalian Country CN - China Event type WRD Language eng - English Country CN - China Keywords RISE microscopy ; Raman ; carbon Subject RIV BM - Solid Matter Physics ; Magnetism OECD category Condensed matter physics (including formerly solid state physics, supercond.) R&D Projects GC15-22102J GA ČR - Czech Science Foundation (CSF) Institutional support FZU-D - RVO:68378271 Annotation We present RISE microscopy of sp2-sp3 hybridized carbon heterostructures. We study a composite of single-wall carbon nanotubes decorated with DNPs and a SWCNT paper overgrown with nanocrystalline diamond. The Raman measurements reveal a complex spectrum consisting from characteristic peaks/bands of both carbon phases. The overlaid SEM image with color-coded Raman map link structural surface properties of the heterostructure with the molecular compound information. That allows an easier and clearer interpretation and understanding of Raman spectra features, shift of the individual peaks and determination of the dominant carbon phase within the sp2-sp3 heterostructure. We found and in-situ confirmed by Raman measurements a structural degradation of samples after electron beam irradiation at higher voltages. It should be noted that Raman laser irradiation at higher powers degraded the sample too, as evidenced in altered Raman spectra and surface features by correlative RISE microscopy. Workplace Institute of Physics Contact Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579 Year of Publishing 2018 Electronic address https://www.elsevier.com/events/conferences/international-conference-on-applied-surface-science/programme
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