Number of the records: 1  

Supersensitive surface imaging with very slow secondary electrons

  1. 1.
    SYSNO0482727
    TitleSupersensitive surface imaging with very slow secondary electrons
    Author(s) Mikmeková, Šárka (UPT-D) RID, SAI, ORCID
    Konvalina, Ivo (UPT-D) RID, ORCID, SAI
    Tsukiori, D. (JP)
    Arai, R. (JP)
    Takano, M. (JP)
    Okuda, K. (JP)
    Müllerová, Ilona (UPT-D) RID, SAI, ORCID
    Frank, Luděk (UPT-D) RID, SAI, ORCID
    Source Title The 3rd East-Asia Microscopy Conference. Abstract Proceeding. - Seoul : Korean Society of Microscopy, 2017
    Conference East-Asia Microscopy Conference /3./, 07.11.2017 - 10.11.2017, Busan
    Document TypeAbstrakt
    Institutional supportUPT-D - RVO:68081731
    Languageeng
    CountryKR
    Keywords supersensitive surface * very slow secondary electrons
    Permanent Linkhttp://hdl.handle.net/11104/0278110
     
Number of the records: 1  

  This site uses cookies to make them easier to browse. Learn more about how we use cookies.