Number of the records: 1
Supersensitive surface imaging with very slow secondary electrons
- 1.0482727 - ÚPT 2018 KR eng A - Abstract
Mikmeková, Šárka - Konvalina, Ivo - Tsukiori, D. - Arai, R. - Takano, M. - Okuda, K. - Müllerová, Ilona - Frank, Luděk
Supersensitive surface imaging with very slow secondary electrons.
The 3rd East-Asia Microscopy Conference. Abstract Proceeding. Seoul: Korean Society of Microscopy, 2017.
[East-Asia Microscopy Conference /3./. 07.11.2017-10.11.2017, Busan]
Institutional support: RVO:68081731
Keywords : supersensitive surface * very slow secondary electrons
OECD category: Materials engineering
Permanent Link: http://hdl.handle.net/11104/0278110
Number of the records: 1