Number of the records: 1  

Ion beams provided by small accelerators for material synthesis and characterization

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    SYSNO ASEP0480644
    Document TypeC - Proceedings Paper (int. conf.)
    R&D Document TypeConference Paper
    TitleIon beams provided by small accelerators for material synthesis and characterization
    Author(s) Macková, Anna (UJF-V) RID, ORCID, SAI
    Havránek, Vladimír (UJF-V) RID, SAI, ORCID
    Number of authors2
    Article number060003
    Source TitleAIP Conference Proceedings, EXOTIC NUCLEI AND NUCLEAR/PARTICLE ASTROPHYSICS (VI). PHYSICS WITH SMALL ACCELERATORS: Proceedings of Carpathian Summer School of Physics 2016 (CSSP16), 1852. - Maryland : American Institute of Physics, 2017 - ISBN 978-0-7354-1526-3
    Number of pages11 s.
    Publication formPrint - P
    ActionCarpathian Summer School of Physics 2016
    Event date26.06.2016 - 09.07.2016
    VEvent locationSinaia
    CountryRO - Romania
    Event typeWRD
    Languageeng - English
    CountryUS - United States
    KeywordsIon beams ; Electrostatic accelerators ; Electronics ; Nanostructures ; Optics and optical physics
    Subject RIVBG - Nuclear, Atomic and Molecular Physics, Colliders
    OECD categoryNuclear physics
    R&D ProjectsLM2015056 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
    GA15-01602S GA ČR - Czech Science Foundation (CSF)
    Institutional supportUJF-V - RVO:61389005
    UT WOS000417364000021
    EID SCOPUS85023198139
    DOI10.10163/1.4984867
    AnnotationThe compact, multipurpose electrostatic tandem accelerators are extensively used for production of ion beams with energies in the range from 400 keV to 24 MeV of almost all elements of the periodic system for the trace element analysis by means of nuclear analytical methods. The ion beams produced by small accelerators have a broad application, mainly for material characterization (Rutherford Back-Scattering spectrometry, Particle Induced X ray Emission analysis, Nuclear Reaction Analysis and Ion-Microprobe with 1 um lateral resolution among others) and for high-energy implantation. Material research belongs to traditionally progressive fields of technology. Due to the continuous miniaturization, the underlying structures are far beyond the analytical limits of the most conventional methods. Ion Beam Analysis (IBA) techniques provide this possibility as they use probes of similar or much smaller dimensions (particles, radiation). Ion beams can be used for the synthesis of new progressive functional nanomaterials for optics, electronics and other applications. Ion beams are extensively used in studies of the fundamental energetic ion interaction with matter as well as in the novel nanostructure synthesis using ion beam irradiation in various amorphous and crystalline materials in order to get structures with extraordinary functional properties. IBA methods serve for investigation of materials coming from material research, industry, micro- and nano-technology, electronics, optics and laser technology, chemical, biological and environmental investigation in general. Main research directions in laboratories employing small accelerators are also the preparation and characterization of micro- and nano-structured materials which are of interest for basic and oriented research in material science, and various studies of biological, geological, environmental and cultural heritage artefacts are provided too.
    WorkplaceNuclear Physics Institute
    ContactMarkéta Sommerová, sommerova@ujf.cas.cz, Tel.: 266 173 228
    Year of Publishing2018
Number of the records: 1  

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