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Scanning thermal microscopy of thermoelectric pulsed laser deposited nanostructures
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SYSNO ASEP 0472513 Document Type C - Proceedings Paper (int. conf.) R&D Document Type Conference Paper Title Scanning thermal microscopy of thermoelectric pulsed laser deposited nanostructures Author(s) Vaniš, Jan (FZU-D)
Zelinka, Jiří (FZU-D) RID
Zeipl, Radek (FZU-D) RID
Jelínek, Miroslav (FZU-D) RID, ORCID
Kocourek, Tomáš (FZU-D) RID, ORCID, SAI
Remsa, Jan (FZU-D) RID, ORCID
Navrátil, Jiří (UMCH-V) RIDNumber of authors 7 Source Title NANOCON 2015: 7th International Conference on Nanomaterials - Research and Application, Conference Proceedings. - Ostrava : TANGER, spol. s r.o., 2015 - ISBN 978-80-87294-63-5 Pages s. 655-659 Number of pages 5 s. Publication form Print - P Action NANOCON 2015. International Conference /7./ Event date 14.10.2015 - 16.10.2015 VEvent location Brno Country CZ - Czech Republic Event type EUR Language eng - English Country CZ - Czech Republic Keywords Scanning thermal microscopy ; figure of merit ; thermoeletric materials Subject RIV BM - Solid Matter Physics ; Magnetism Institutional support FZU-D - RVO:68378271 ; UMCH-V - RVO:61389013 UT WOS 000374708800114 EID SCOPUS 84962859646 Annotation New materials with high possible figure of merit ZT are of high interest as a promising candidates for thermoelectric applications such as energy harvesting. Miniaturization of such systems tends toward developing of the suitable characterization method with nanometer resolution ability. In our contribution, we present the development and experimental results of a simple scanning probe microscopy method for the relative thermal conductivity characterization. The possibility of the setup is demonstrated on the set of different thin thermoelectric layers grown from hot pressed targets by pulsed laser deposition on the reference Si substrate. All the measurements were performed on the commercial Veeco Multimode scanning AFM/STM microscope with home developed controller and by using PicoCal Inc. bolometer probes with tungsten resistive path. All the experiments were done in the air at the ambient condition. Additional sample treatment for the measurement will be also briefly described Workplace Institute of Physics Contact Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579 Year of Publishing 2017
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