Number of the records: 1  

Scanning thermal microscopy of thermoelectric pulsed laser deposited nanostructures

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    SYSNO ASEP0472513
    Document TypeC - Proceedings Paper (int. conf.)
    R&D Document TypeConference Paper
    TitleScanning thermal microscopy of thermoelectric pulsed laser deposited nanostructures
    Author(s) Vaniš, Jan (FZU-D)
    Zelinka, Jiří (FZU-D) RID
    Zeipl, Radek (FZU-D) RID
    Jelínek, Miroslav (FZU-D) RID, ORCID
    Kocourek, Tomáš (FZU-D) RID, ORCID, SAI
    Remsa, Jan (FZU-D) RID, ORCID
    Navrátil, Jiří (UMCH-V) RID
    Number of authors7
    Source TitleNANOCON 2015: 7th International Conference on Nanomaterials - Research and Application, Conference Proceedings. - Ostrava : TANGER, spol. s r.o., 2015 - ISBN 978-80-87294-63-5
    Pagess. 655-659
    Number of pages5 s.
    Publication formPrint - P
    ActionNANOCON 2015. International Conference /7./
    Event date14.10.2015 - 16.10.2015
    VEvent locationBrno
    CountryCZ - Czech Republic
    Event typeEUR
    Languageeng - English
    CountryCZ - Czech Republic
    KeywordsScanning thermal microscopy ; figure of merit ; thermoeletric materials
    Subject RIVBM - Solid Matter Physics ; Magnetism
    Institutional supportFZU-D - RVO:68378271 ; UMCH-V - RVO:61389013
    UT WOS000374708800114
    EID SCOPUS84962859646
    AnnotationNew materials with high possible figure of merit ZT are of high interest as a promising candidates for thermoelectric applications such as energy harvesting. Miniaturization of such systems tends toward developing of the suitable characterization method with nanometer resolution ability. In our contribution, we present the development and experimental results of a simple scanning probe microscopy method for the relative thermal conductivity characterization. The possibility of the setup is demonstrated on the set of different thin thermoelectric layers grown from hot pressed targets by pulsed laser deposition on the reference Si substrate. All the measurements were performed on the commercial Veeco Multimode scanning AFM/STM microscope with home developed controller and by using PicoCal Inc. bolometer probes with tungsten resistive path. All the experiments were done in the air at the ambient condition. Additional sample treatment for the measurement will be also briefly described
    WorkplaceInstitute of Physics
    ContactKristina Potocká, potocka@fzu.cz, Tel.: 220 318 579
    Year of Publishing2017
Number of the records: 1  

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